With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
The MeshTest testbed is designed to subject wireless devices and protocols to realistic and repeatable mobile scenarios, including multi-hop and disconnected topologies. The testb...
Background: Intensity values measured by Affymetrix microarrays have to be both normalized, to be able to compare different microarrays by removing non-biological variation, and s...
Roel G. W. Verhaak, Frank J. T. Staal, Peter J. M....
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
— The rapid growth in the popularity of cellular networks has led to aggressive deployment and a rapid expansion of services. Services based on the integration of these networks ...
Mike P. Wittie, Brett Stone-Gross, Kevin C. Almero...