7 search results - page 1 / 2 » Memory testing with a RISC microcontroller |
DATE
2010
IEEE
14 years 4 months ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
ET
2008
13 years 10 months ago
2008
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
FDTC
2010
Springer
13 years 9 months ago
2010
Springer
This paper introduces some new types of optical fault attacks called fault masking attacks. These attacks are aimed at disrupting of the normal memory operation through preventing ...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
IPSN
2007
Springer
14 years 5 months ago
2007
Springer
Many sensor nodes contain resource constrained microcontrollers where user level applications, operating system components, and device drivers share a single address space with no...