711 search results - page 62 / 143 » Methodological frameworks for large-scale network analysis a... |
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
EMSOFT
2009
Springer
14 years 3 months ago
2009
Springer
This paper advocates a strict compositional and hybrid approach for obtaining key (performance) metrics of embedded At its core the developed methodology abstracts system componen...
ISLPED
2006
ACM
14 years 3 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
ICRA
2000
IEEE
14 years 1 months ago
2000
IEEE
A supply chain network can be viewed as a network of facilities in which a customer order will flow through internal business processes such as procurement, production, and transp...
ICANN
1997
Springer
14 years 1 months ago
1997
Springer
The processing or the recognition of non stationary process with neural networks is a challenging and yet unsolved issue. The paper discuss the general pattern recognition framewor...