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ISCAS
2007
IEEE
94views Hardware» more  ISCAS 2007»
14 years 1 months ago
Fundamental Bounds on Power Reduction during Data-Retention in Standby SRAM
Abstract— We study leakage-power reduction in standby random access memories (SRAMs) during data-retention. An SRAM cell requires a minimum critical supply voltage (DRV) above wh...
Animesh Kumar, Huifang Qin, Prakash Ishwar, Jan M....
ICCAD
1995
IEEE
135views Hardware» more  ICCAD 1995»
13 years 11 months ago
An iterative improvement algorithm for low power data path synthesis
We address the problem of minimizing power consumption in behavioral synthesis of data-dominated circuits. The complex nature of power as a cost function implies that the effects ...
Anand Raghunathan, Niraj K. Jha
ICNP
2006
IEEE
14 years 1 months ago
O-MAC: A Receiver Centric Power Management Protocol
— Energy efficiency is widely understood to be one of the dominant considerations for Wireless Sensor Networks. Based on historical data and technology trends, the receiver ener...
Hui Cao, Ken Parker, Anish Arora
ICCAD
2006
IEEE
149views Hardware» more  ICCAD 2006»
14 years 1 months ago
Fast decap allocation based on algebraic multigrid
Decap (decoupling capacitor) is an effective technique for suppressing power supply noise. Nevertheless, over-usage of decap usually causes excessive power dissipation. Therefore...
Cheng Zhuo, Jiang Hu, Min Zhao, Kangsheng Chen
VTS
2008
IEEE
77views Hardware» more  VTS 2008»
14 years 2 months ago
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty