Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
— In this paper, we evaluate the performance of adaptive algorithms for selecting the number of redundant packets by jointly considering the forward error correction (FEC) and au...
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
We present a unified view of two state-of-theart non-projective dependency parsers, both approximate: the loopy belief propagation parser of Smith and Eisner (2008) and the relaxe...