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VTS
2008
IEEE
104views Hardware» more  VTS 2008»
15 years 10 months ago
Signature Rollback - A Technique for Testing Robust Circuits
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
Uranmandakh Amgalan, Christian Hachmann, Sybille H...
AINA
2007
IEEE
15 years 10 months ago
A Distributed and Dynamic Data Gathering Protocol for Sensor Networks
In this paper we propose a distributed, self organizing, robust and energy efficient data gathering algorithm for sensor networks operating in environments where all the sensor n...
Hüseyin Özgür Tan, Ibrahim Korpeogl...
CCGRID
2007
IEEE
15 years 10 months ago
Dynamic Malleability in Iterative MPI Applications
Malleability enables a parallel application’s execution system to split or merge processes modifying granularity. While process migration is widely used to adapt applications to...
Kaoutar El Maghraoui, Travis J. Desell, Boleslaw K...
DATE
2007
IEEE
114views Hardware» more  DATE 2007»
15 years 10 months ago
Performance aware secure code partitioning
Many embedded applications exist where decisions are made using sensitive information. A critical issue in such applications is to ensure that data is accessed only by authorized ...
Sri Hari Krishna Narayanan, Mahmut T. Kandemir, Ri...
113
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GLVLSI
2007
IEEE
189views VLSI» more  GLVLSI 2007»
15 years 10 months ago
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza ...