Very thorough online self-test is essential for overcoming major reliability challenges such as early-life failures and transistor aging in advanced technologies. This paper demon...
Abstract. Increasing integration densities and the emergence of nanotechnology cause issues related to reliability and power consumption to become dominant factors for the design o...
Tim Wegner, Claas Cornelius, Andreas Tockhorn, Dir...
3D stacked circuits reduce communication delay in multicore system-on-chips (SoCs) and enable heterogeneous integration of cores, memories, sensors, and RF devices. However, vertic...
Mohamed M. Sabry, Ayse Kivilcim Coskun, David Atie...
Concurrent programming is becoming more important due to the growing dominance of multi-core processors and the prevalence of graphical user interfaces (GUIs). To prepare students...
In a Multi-Variant Execution Environment (MVEE), several slightly different versions of the same program are executed in lockstep. While this is done, a monitor compares the behav...
Babak Salamat, Todd Jackson, Andreas Gal, Michael ...