1992 search results - page 91 / 399 » Model Based Testing with Labelled Transition Systems |
99
Voted
DAC
2006
ACM
16 years 3 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
128
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ISSS
1999
IEEE
15 years 7 months ago
1999
IEEE
The policy optimization problem for dynamic power management has received considerable attention in the recent past. We formulate policy optimization as a constrained optimization...
123
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ICST
2008
IEEE
15 years 9 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
125
Voted
HYBRID
2000
Springer
15 years 6 months ago
2000
Springer
In this paper, we formulate the problem of characterizing the stability of a piecewise affine (PWA) system as a verification problem. The basic idea is to take the whole Rn as the ...
132
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FGR
2006
IEEE
15 years 8 months ago
2006
IEEE
Current 2D face recognition systems encounter difficulties in recognizing faces with large pose variations. Utilizing the pose-invariant features of 3D face data has the potentia...