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ICST
2010
IEEE
13 years 6 months ago
Generating Transition Probabilities for Automatic Model-Based Test Generation
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
14 years 1 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
MTV
2005
IEEE
128views Hardware» more  MTV 2005»
14 years 1 months ago
Automated Extraction of Structural Information from SystemC-based IP for Validation
The increasing complexity and size of system level design models introduces a difficult challenge for validating them. Hence, in most industries, design validation takes a large p...
David Berner, Hiren D. Patel, Deepak Mathaikutty, ...
ICSEA
2007
IEEE
14 years 1 months ago
Test Data Generation from UML State Machine Diagrams using GAs
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir...
TVLSI
2008
140views more  TVLSI 2008»
13 years 7 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad