41 search results - page 5 / 9 » Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method... |
ASPDAC
2008
ACM
13 years 9 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ETT
2002
13 years 7 months ago
2002
A method of rare event simulation, termed here quantum simulation, and known also (with some variations) as population Monte Carlo, and Sequential Markov Chain simulation, is appli...
ICCAD
2003
IEEE
14 years 21 days ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
NECO
2007
13 years 6 months ago
2007
It is well-known that, in unidentifiable models, the Bayes estimation provides much better generalization performance than the maximum likelihood (ML) estimation. However, its ac...
ISQED
2005
IEEE
14 years 1 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...