31 search results - page 2 / 7 » Modeling Techniques and Tests for Partial Faults in Memory D... |
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
Flash memory has become virtually indispensable in most mobile devices, such as mobile phones, digital cameras, mp3 players, etc. In order for mobile devices to successfully provi...
SBMF
2009
Springer
14 years 1 months ago
2009
Springer
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
VLSID
2006
IEEE
14 years 7 months ago
2006
IEEE
In this paper a new technique for partial product reduction based on the use of look-up tables for efficient processing is presented. We describe how to construct counter devices ...