31 search results - page 3 / 7 » Modeling Techniques and Tests for Partial Faults in Memory D... |
STORAGESS
2006
ACM
14 years 28 days ago
2006
ACM
Batch-correlated failures result from the manifestation of a common defect in most, if not all, disk drives belonging to the same production batch. They are much less frequent tha...
TVLSI
1998
13 years 6 months ago
1998
Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...
ISCA
2005
IEEE
14 years 17 days ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
ET
2000
13 years 6 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
CASES
2008
ACM
13 years 9 months ago
2008
ACM
While technology advances have made MPSoCs a standard architecture for embedded systems, their applicability is increasingly being challenged by dramatic increases in the amount o...