31 search results - page 4 / 7 » Modeling Techniques and Tests for Partial Faults in Memory D... |
FPGA
2006
ACM
13 years 11 months ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...
ATS
2009
IEEE
14 years 26 days ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
ET
2002
13 years 7 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
TSE
2011
13 years 2 months ago
2011
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...