156 search results - page 1 / 32 » Modeling and Characterizing Power Variability in Multicore A... |
ISPASS
2007
IEEE
14 years 2 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
In this paper, we investigate a new architecture-level thermal characterization problem from behavioral modeling perspective to address the emerging thermal related analysis and o...
ECCTD
2011
12 years 8 months ago
2011
⎯ Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate th...
ISLPED
1996
ACM
14 years 20 days ago
1996
ACM
We present an architectural power simulation technique for PLA-based controllers. The contributions of this work are (1) a simple but ecient power characterization of PLAs; and (2...
ISCA
2008
IEEE
14 years 2 months ago
2008
IEEE
Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introd...