170 search results - page 5 / 34 » Modeling and analyzing NBTI in the presence of Process Varia... |
ACSAC
2010
IEEE
13 years 5 months ago
2010
IEEE
Code injection continues to pose a serious threat to computer systems. Among existing solutions, W X is a notable approach to prevent the execution of injected code. In this paper...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DAGM
2010
Springer
13 years 6 months ago
2010
Springer
We propose a convex variational framework to compute high resolution images from a low resolution video. The image formation process is analyzed to provide to a well designed model...