Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
Jungsub Kim, Mary Jane Irwin, Narayanan Vijaykrish...
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
In this paper, we propose a new machine learning approach based on AFS (Axiomatic Fuzzy Sets) fuzzy logic, in attempt to provide a better model with interpretability. First, we wil...
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...