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ASPDAC
2010
ACM
165views Hardware» more  ASPDAC 2010»
13 years 8 months ago
Dynamic power estimation for deep submicron circuits with process variation
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
Quang Dinh, Deming Chen, Martin D. F. Wong
ETT
2002
93views Education» more  ETT 2002»
13 years 9 months ago
Quantum simulation - rare event simulation by means of cloning, thinning and distortion
A method of rare event simulation, termed here quantum simulation, and known also (with some variations) as population Monte Carlo, and Sequential Markov Chain simulation, is appli...
R. G. Addie
ISCAS
2008
IEEE
122views Hardware» more  ISCAS 2008»
14 years 4 months ago
A nano-CMOS process variation induced read failure tolerant SRAM cell
— In a nanoscale technology, memory bits are highly susceptible to process variation induced read/write failures. To address the above problem, in this paper a new memory cell is...
Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhi...
GLOBECOM
2008
IEEE
13 years 10 months ago
Influence of Node Location Distributions on the Structure of Ad Hoc and Mesh Networks
We study the impact of the distribution of node locations on key properties of wireless networks. In particular, using Monte Carlo simulations we study in detail the behavior of av...
Janne Riihijärvi, Marina Petrova, Petri M&aum...
JEI
2006
110views more  JEI 2006»
13 years 9 months ago
Empirical formula for creating error bars for the method of paired comparison
The method of paired comparison based on Thurstone's Case V of his Law of Comparative Judgments is often used as a psychophysical method to derive interval scales of perceptua...
Ethan D. Montag