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ICCAD
2007
IEEE
161views Hardware» more  ICCAD 2007»
14 years 6 months ago
Clustering based pruning for statistical criticality computation under process variations
— We present a new linear time technique to compute criticality information in a timing graph by dividing it into “zones”. Errors in using tightness probabilities for critica...
Hushrav Mogal, Haifeng Qian, Sachin S. Sapatnekar,...
ICCAD
2006
IEEE
183views Hardware» more  ICCAD 2006»
14 years 6 months ago
Soft error derating computation in sequential circuits
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
Hossein Asadi, Mehdi Baradaran Tahoori
ISQED
2009
IEEE
111views Hardware» more  ISQED 2009»
14 years 4 months ago
Efficient statistical analysis of read timing failures in SRAM circuits
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
DAC
2009
ACM
14 years 4 months ago
Yield-driven iterative robust circuit optimization algorithm
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...
Yan Li, Vladimir Stojanovic
KBSE
2009
IEEE
14 years 4 months ago
Understanding the Value of Software Engineering Technologies
SEESAW combines AI search tools, a Monte Carlo simulator, and some software process models. We show here that, when selecting technologies for a software project, SEESAW out-perfo...
Phillip Green II, Tim Menzies, Steve Williams, Ous...