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DFT
2009
IEEE
106views VLSI» more  DFT 2009»
14 years 3 months ago
Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba
ICCAD
1998
IEEE
116views Hardware» more  ICCAD 1998»
14 years 26 days ago
On primitive fault test generation in non-scan sequential circuits
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
Ramesh C. Tekumalla, Premachandran R. Menon
HCI
2009
13 years 6 months ago
Supporting Scenario-Based Product Design and Its Adapters: An Informal Framework for Scenario Creation and Use
This paper proposes a support tool for designers who have realized the potential benefits of using a scenario-based approach, yet need a more concrete guidance for its implementati...
Irene Anggreeni, Mascha van der Voort
ICALP
2009
Springer
14 years 9 months ago
Testing Fourier Dimensionality and Sparsity
We present a range of new results for testing properties of Boolean functions that are defined in terms of the Fourier spectrum. Broadly speaking, our results show that the propert...
Parikshit Gopalan, Ryan O'Donnell, Rocco A. Served...
APPROX
2007
Springer
153views Algorithms» more  APPROX 2007»
14 years 2 months ago
Distribution-Free Testing Lower Bounds for Basic Boolean Functions
: In the distribution-free property testing model, the distance between functions is measured with respect to an arbitrary and unknown probability distribution D over the input dom...
Dana Glasner, Rocco A. Servedio