—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
This paper considers z-domain transfer functions whose denominator polynomial possesses the property that the coefficient of zi is greater than the coefficient of zi-1 . Such trans...
Christian S. Gargour, Venkat Ramachandran, Ravi P....
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...