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ICCAD
2003
IEEE
151views Hardware» more  ICCAD 2003»
14 years 26 days ago
On Compacting Test Response Data Containing Unknown Values
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
JAVACARD
2000
13 years 11 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
BMCBI
2010
201views more  BMCBI 2010»
13 years 5 months ago
IntelliGO: a new vector-based semantic similarity measure including annotation origin
Background: The Gene Ontology (GO) is a well known controlled vocabulary describing the biological process, molecular function and cellular component aspects of gene annotation. I...
Sidahmed Benabderrahmane, Malika Smaïl-Tabbon...
BMCBI
2008
133views more  BMCBI 2008»
13 years 7 months ago
ElliPro: a new structure-based tool for the prediction of antibody epitopes
Background: Reliable prediction of antibody, or B-cell, epitopes remains challenging yet highly desirable for the design of vaccines and immunodiagnostics. A correlation between a...
Julia V. Ponomarenko, Huynh-Hoa Bui, Wei Li, Nicho...
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
13 years 11 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer