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KBSE
2005
IEEE
14 years 3 months ago
Automatic test factoring for java
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenti...
David Saff, Shay Artzi, Jeff H. Perkins, Michael D...
RTSS
2005
IEEE
14 years 3 months ago
Event Count Automata: A State-Based Model for Stream Processing Systems
Recently there has been a growing interest in models and methods targeted towards the (co)design of stream processing applications; e.g. those for audio/video processing. Streams ...
Samarjit Chakraborty, Linh T. X. Phan, P. S. Thiag...
TRIDENTCOM
2005
IEEE
14 years 3 months ago
TBI: End-to-End Network Performance Measurement Testbed for Empirical Bottleneck Detection
— Recent advances in networking include new bandwidth-intensive applications, sophisticated protocols that enable real-time data and multimedia delivery and aspects of network se...
Prasad Calyam, Dima Krymskiy, Mukundan Sridharan, ...
VISUALIZATION
2005
IEEE
14 years 3 months ago
Topology-driven Surface Mappings with Robust Feature Alignment
Topological concepts and techniques have been broadly applied in computer graphics and geometric modeling. However, the homotopy type of a mapping between two surfaces has not bee...
Christopher Carner, Miao Jin, Xianfeng Gu, Hong Qi...
ISPD
2005
ACM
151views Hardware» more  ISPD 2005»
14 years 3 months ago
Thermal via placement in 3D ICs
As thermal problems become more evident, new physical design paradigms and tools are needed to alleviate them. Incorporating thermal vias into integrated circuits (ICs) is a promi...
Brent Goplen, Sachin S. Sapatnekar
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