Gabor wavelet related feature extraction and classification is an important topic in image analysis and pattern recognition. Gabor features can be used either holistically or anal...
Don't-care conditions provide additional flexibility in logic synthesis and optimization. However, most work only focuses on the gate level because it is difficult to handle ...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...