853 search results - page 4 / 171 » New test approach for embedded applications |
IJON
2006
13 years 7 months ago
2006
A classifier system is a machine learning system that learns syntactically simple string rules (called classifiers) through a genetic algorithm to guide its performance in an arbi...
MTDT
2003
IEEE
14 years 20 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
EMSOFT
2005
Springer
14 years 26 days ago
2005
Springer
UPPAAL-TRON is a new tool for model based online black-box conformance testing of real-time embedded systems specified as timed automata. In this paper we present our experiences...
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
ISCA
2003
IEEE
14 years 20 days ago
2003
IEEE
Although adaptive processors can exploit application variability to improve performance or save energy, effectively managing their adaptivity is challenging. To address this probl...