853 search results - page 6 / 171 » New test approach for embedded applications |
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...
DATE
2003
IEEE
14 years 21 days ago
2003
IEEE
—A new approach for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t = 2k − 1, Bose and Bose-Lin codes. The design technique fo...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
EUROSYS
2010
ACM
14 years 4 months ago
2010
ACM
The benefits of virtualized IT environments, such as compute clouds, have drawn interested enterprises to migrate their applications onto new platforms to gain the advantages of ...