853 search results - page 8 / 171 » New test approach for embedded applications |
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ITC
1991
IEEE
13 years 11 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
SCOPES
2004
Springer
14 years 23 days ago
2004
Springer
New embedded signal processing architectures are emerging that are composed of loosely coupled heterogeneous components like CPUs or DSPs, specialized IP cores, reconfigurable uni...
TSMC
2008
13 years 7 months ago
2008
This paper proposes a new perspective for solving systems of complex nonlinear equations by simply viewing them as a multiobjective optimization problem. Every equation in the syst...
IPPS
2003
IEEE
14 years 21 days ago
2003
IEEE
Over the past several decades, the compiler research community has developed a number of sophisticated and powerful algorithms for a varierty of code improvements. While there are...