Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
The design procedure of 2nd - and 3rd -order low-sensitivity lowpower allpole active resistance-capacitance (RC) filters, using the impedance tapering design method has already be...
Dynamic frequency scaling and dynamic voltage scaling have been developed to save power and/or energy for general purpose computing platforms and high-end embedded systems. This p...
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
Process variation has become a critical problem in modern VLSI fabrication. In the presence of process variation, buffer insertion problem under performance constraints becomes mo...