980 search results - page 14 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
TC
2008
13 years 9 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
IOLTS
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
VTS
1995
IEEE
14 years 22 days ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
IWANN
1995
Springer
14 years 22 days ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
ATS
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...