A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage

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This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulated over an extension ﬁeld of GF(2δ

Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir

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Error Detecting Codes | Extension ﬁeld | IOLTS 2005 | Software Engineering | Test Pattern Generator |

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Added	25 Jun 2010
Updated	25 Jun 2010
Type	Conference
Year	2005
Where	IOLTS
Authors	Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir

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A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage

Error Detecting Codes | Extension ﬁeld | IOLTS 2005 | Software Engineering | Test Pattern Generator |

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