A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage

This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulated over an extension field of GF(2δ

• Type: Conference
• Year: 2005
• Where: IOLTS
• Authors: Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
• Keywords: Error Detecting Codes, Extension field, IOLTS 2005, Software Engineering, Test Pattern Generator