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IOLTS
2005
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IOLTS 2005
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A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
14 years 4 months ago
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This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulated over an extension field of GF(2δ
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
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Error Detecting Codes
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IOLTS 2005
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Test Pattern Generator
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Added
25 Jun 2010
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25 Jun 2010
Type
Conference
Year
2005
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IOLTS
Authors
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
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Hardware Study Group
Computer Vision