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IOLTS
2005
IEEE

A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage

14 years 5 months ago
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulated over an extension field of GF(2δ
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where IOLTS
Authors Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
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