980 search results - page 19 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
TVLSI
2008
13 years 9 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
JOT
2010
13 years 7 months ago
2010
Abstract We propose a novel testing technique for object-oriented programs. Based on the state and activity models of a system, we construct an intermediate representation, which w...
PTS
2010
13 years 7 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...