980 search results - page 27 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
BMCBI
2006
13 years 9 months ago
2006
Background: Many vital biological processes, including transcription and splicing, require a combination of short, degenerate sequence patterns, or motifs, adjacent to defined seq...
DFT
1997
IEEE
14 years 1 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
TVLSI
2010
13 years 3 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ITC
1992
IEEE
14 years 1 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
COMPSAC
2003
IEEE
14 years 2 months ago
2003
IEEE
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...