980 search results - page 28 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
JSS
2011
13 years 23 hour ago
2011
Forecasting workflow activity durations is of great importance to support satisfactory QoS in workflow systems. Traditionally, a workflow system is often designed to facilitate the...
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
TCAD
2011
13 years 4 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
ATS
1998
IEEE
14 years 1 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
VLSID
2005
IEEE
14 years 9 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...