980 search results - page 32 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ICST
2009
IEEE
13 years 6 months ago
2009
IEEE
A software development process is conceptually an abstract form of model transformation, starting from an enduser model of requirements, through to a system model for which code c...
INFORMATICALT
2007
13 years 9 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
DAC
1994
ACM
14 years 1 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DSD
2010
IEEE
13 years 9 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
IPPS
1998
IEEE
14 years 1 months ago
1998
IEEE
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...