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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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SIGSOFT
2007
ACM
14 years 10 months ago
CTG: a connectivity trace generator for testing the performance of opportunistic mobile systems
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
Roberta Calegari, Mirco Musolesi, Franco Raimondi,...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
14 years 2 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 9 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 2 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
TAP
2010
Springer
126views Hardware» more  TAP 2010»
14 years 2 months ago
DyGen: Automatic Generation of High-Coverage Tests via Mining Gigabytes of Dynamic Traces
Unit tests of object-oriented code exercise particular sequences of method calls. A key problem when automatically generating unit tests that achieve high structural code coverage ...
Suresh Thummalapenta, Jonathan de Halleux, Nikolai...