980 search results - page 46 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ASYNC
2006
IEEE
14 years 3 months ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ICRA
2010
IEEE
13 years 7 months ago
2010
IEEE
— This paper presents the development of a biomechatronic knee prosthesis for transfemoral amputees. This kind of prostheses are considered ‘intelligent’ because they are abl...
IOLTS
2000
IEEE
14 years 1 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
IIE
2007
13 years 9 months ago
2007
Automatic assessment of programming exercises is typically based on testing approach. Most automatic assessment frameworks execute tests and evaluate test results automatically, bu...