980 search results - page 53 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ITC
2000
IEEE
14 years 20 days ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ROMAN
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract— This paper describes a novel algorithm for autonomous and incremental learning of motion pattern primitives by observation of human motion. Human motion patterns are ed...
DAC
2005
ACM
13 years 11 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
ICES
2000
Springer
14 years 21 days ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...