1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
Abstract— This paper describes a novel algorithm for autonomous and incremental learning of motion pattern primitives by observation of human motion. Human motion patterns are ed...
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...