980 search results - page 56 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ET
2006
13 years 9 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embe...
ICCD
2003
IEEE
14 years 2 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
COMPSAC
2008
IEEE
13 years 9 months ago
2008
IEEE
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
FASE
2007
Springer
14 years 3 months ago
2007
Springer
Although unit tests are recognized as an important tool in software development, programmers prefer to write code, rather than unit tests. Despite the emergence of tools like JUni...