We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embe...
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
R. Barzin, S. Fukushima, William E. Howden, S. Sha...
Although unit tests are recognized as an important tool in software development, programmers prefer to write code, rather than unit tests. Despite the emergence of tools like JUni...