980 search results - page 64 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DATE
2002
IEEE
14 years 2 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
ITC
1994
IEEE
14 years 1 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
PR
2006
13 years 9 months ago
2006
In many pattern recognition applications, high-dimensional feature vectors impose a high computational cost as well as the risk of "overfitting". Feature Selection addre...
ISBI
2007
IEEE
14 years 3 months ago
2007
IEEE
In this paper we present a novel tag removal method for tagged cardiac MR images. This method is based on a 2D bandstop filtering technique, which selectively attenuates the tag ...
KBSE
2007
IEEE
14 years 3 months ago
2007
IEEE
Achieving high structural coverage such as branch coverage in objectoriented programs is an important and yet challenging goal due to two main challenges. First, some branches inv...