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DDECS
2007
IEEE
127views Hardware» more  DDECS 2007»
14 years 3 months ago
Instance Generation for SAT-based ATPG
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
Daniel Tille, Görschwin Fey, Rolf Drechsler
DDECS
2008
IEEE
97views Hardware» more  DDECS 2008»
14 years 3 months ago
Incremental SAT Instance Generation for SAT-based ATPG
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
Daniel Tille, Rolf Drechsler
ISSTA
2004
ACM
14 years 2 months ago
Optimal strategies for testing nondeterministic systems
This paper deals with testing of nondeterministic software systems. We assume that a model of the nondeterministic system is given by a directed graph with two kind of vertices: s...
Lev Nachmanson, Margus Veanes, Wolfram Schulte, Ni...
ICCAD
1995
IEEE
136views Hardware» more  ICCAD 1995»
14 years 18 days ago
A controller-based design-for-testability technique for controller-data path circuits
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
Sujit Dey, Vijay Gangaram, Miodrag Potkonjak
SSIRI
2010
14 years 28 days ago
An Industrial Case Study on Speeding Up User Acceptance Testing by Mining Execution Logs
—Software reliability is defined as the probability of failure-free operation for a period of time, under certain conditions. To determine whether the reliability of an applicat...
Zhen Ming Jiang, Alberto Avritzer, Emad Shihab, Ah...