980 search results - page 79 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DT
2000
13 years 8 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
KDD
2008
ACM
14 years 9 months ago
2008
ACM
We propose a new method for detecting patterns of anomalies in categorical datasets. We assume that anomalies are generated by some underlying process which affects only a particu...
ITC
2002
IEEE
14 years 1 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
CEC
2008
IEEE
13 years 9 months ago
2008
IEEE
Given the great amount of data that are generated of the experiments to analyze information of extracted chemical fluids of the brain of a rodent, arises the necessity to design an...
DATE
1997
IEEE
14 years 1 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...