980 search results - page 7 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
VTS
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
ITC
1997
IEEE
14 years 1 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
ICSE
2009
IEEE-ACM
13 years 7 months ago
2009
IEEE-ACM
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
ICSEA
2007
IEEE
14 years 3 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...