1721 search results - page 103 / 345 » On Active and Passive Testing |
110
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ASYNC
2007
IEEE
15 years 11 months ago
2007
IEEE
On-chip high-bandwidth sampling circuits supplement traditional test and debug techniques by non-invasively probing analog voltages for off-chip measurement. Existing circuits rel...
112
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ITC
1998
IEEE
15 years 8 months ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
118
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IROS
2009
IEEE
15 years 11 months ago
2009
IEEE
— In this paper, the basic running performance of the cylindrical tracked vehicle with sideways mobility is presented. The crawler mechanism is of circular cross-section and has ...
148
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EUROSPI
2007
Springer
15 years 10 months ago
2007
Springer
Test-driven development (TDD) is entering the mainstream of software development. We examined the software development process for the purpose of evaluation of the TDD impact, with...
125
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AINA
2005
IEEE
15 years 10 months ago
2005
IEEE
More and more sensor networks will be deployed in the place where people are living, studying, and working. These sensor networks bring us the convenience of accessing information...