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» On Active and Passive Testing
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VTS
1996
IEEE
126views Hardware» more  VTS 1996»
15 years 8 months ago
Automatic test generation using genetically-engineered distinguishing sequences
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
COMPSAC
2008
IEEE
15 years 10 months ago
Constraint Reasoning in Path-Oriented Random Testing
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...
Arnaud Gotlieb, Matthieu Petit
DATE
2000
IEEE
65views Hardware» more  DATE 2000»
15 years 8 months ago
Test Quality and Fault Risk in Digital Filter Datapath BIST
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
Laurence Goodby, Alex Orailoglu
ADAEUROPE
1997
Springer
15 years 8 months ago
Systematic Unit-Testing of Ada Programs
The systematic test is an inevitable part of the verification and validation process for software. Overall support for all testing activities is currently not available in a singl...
Joachim Wegener, Ines Fey
DAC
2004
ACM
15 years 9 months ago
A new state assignment technique for testing and low power
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...
Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J....