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» On Applying Set Covering Models to Test Set Compaction
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ITC
1994
IEEE
111views Hardware» more  ITC 1994»
13 years 11 months ago
Simulation Results of an Efficient Defect-Analysis Procedure
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
Olaf Stern, Hans-Joachim Wunderlich
ATAL
2008
Springer
13 years 9 months ago
Coalitional skill games
We consider Coalitional Skill Games (CSGs), a simple model of cooperation among agents. This is a restricted form of coalitional games, where each agent has a set of skills that a...
Yoram Bachrach, Jeffrey S. Rosenschein
ISSTA
2006
ACM
14 years 1 months ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 15 days ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
3DPVT
2006
IEEE
174views Visualization» more  3DPVT 2006»
14 years 1 months ago
Two Stage View Planning for Large-Scale Site Modeling
We present a systematic view planning method to assist construction of 3-D models of large outdoor sites using a mobile robot platform with mounted scanner. In the first stage, w...
Paul Blaer, Peter K. Allen