799 search results - page 85 / 160 » On Failures and Faults |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
ISCA
2012
IEEE
11 years 11 months ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
ATS
2004
IEEE
14 years 17 days ago
2004
IEEE
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
TCAD
2010
13 years 3 months ago
2010
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...