372 search results - page 12 / 75 » On Fault Testing for Reversible Circuits |
ICCAD
1995
IEEE
14 years 4 days ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
VLSID
2010
IEEE
14 years 14 days ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
ICCAD
1998
IEEE
14 years 26 days ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ISMVL
2005
IEEE
14 years 2 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...