Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
GEGICK, MICHAEL CHARLES. Predicting Attack-prone Components with Source Code Static Analyzers. (Under the direction of Laurie Williams). No single vulnerability detection techniqu...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Graduates of computer science degree programs are increasingly being asked to maintain large, multi-threaded software systems; however, the maintenance of such systems is typicall...
Scott D. Fleming, Eileen Kraemer, R. E. Kurt Stire...
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...