1187 search results - page 178 / 238 » On Modeling Cross-Talk Faults |
MICRO
2006
IEEE
13 years 8 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
ICST
2009
IEEE
14 years 3 months ago
2009
IEEE
GEGICK, MICHAEL CHARLES. Predicting Attack-prone Components with Source Code Static Analyzers. (Under the direction of Laurie Williams). No single vulnerability detection techniqu...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ICSE
2008
IEEE-ACM
14 years 9 months ago
2008
IEEE-ACM
Graduates of computer science degree programs are increasingly being asked to maintain large, multi-threaded software systems; however, the maintenance of such systems is typicall...
SIGSOFT
2008
ACM
14 years 9 months ago
2008
ACM
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...