1187 search results - page 189 / 238 » On Modeling Cross-Talk Faults |
ATS
2003
IEEE
14 years 2 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ISCAS
2003
IEEE
14 years 2 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
CHARME
2003
Springer
14 years 1 months ago
2003
Springer
Intrusion-tolerance is the technique of using fault-tolerance to achieve security properties. Assuming that faults, both benign and Byzantine, are unavoidable, the main goal of Int...
GCC
2003
Springer
14 years 1 months ago
2003
Springer
Abstract. The common goals of the Grid and peer-to-peer communities have brought them in close proximity. Both the technologies overlay a collaborative resource-sharing infrastruct...