1187 search results - page 34 / 238 » On Modeling Cross-Talk Faults |
VLSID
2010
IEEE
14 years 16 days ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
ETS
2007
IEEE
14 years 3 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
VTS
2005
IEEE
14 years 2 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
ICT
2004
Springer
14 years 2 months ago
2004
Springer
: this document presents a generic model capturing the essential structural and behavioral characteristics of network components in the light of fault management. The generic model...